1. Digital hardware testing. transistor-level fault modeling and testing
پدیدآورنده : Rajsuman, Rochit., Rochit Rajsuman
کتابخانه: كتابخانه و مركز اسناد دانشگاه كردستان (کردستان)
موضوع : ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
رده :
TK
7888
.
4
.
R35
2. Proceedings: International Workshop on Memory Technology, Design, and Testing
پدیدآورنده : / edited by F. Lombardi, R. Rajsuman, and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Council
کتابخانه: المكتبة المركزية ومركز الأرشيف (طهران)
موضوع : Semiconductor storage devices,Random access memory,-- Testing Congresses,-- Congresses
رده :
621
.
39732
I11P
1997
3. Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, 7-8 August 2000, San Jose, California
پدیدآورنده : edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Society
کتابخانه: کتابخانه مرکزی و مرکز اطلاع رسانی دانشگاه فردوسی مشهد (خراسان رضوی)
موضوع : Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4
I334
2000
4. Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
پدیدآورنده : IEEE International Workshop on Memory Technology, Design, and Testing )1994 : San Jose, Calif.(
کتابخانه: (طهران)
موضوع : Semiconductor storage devices - Testing - Congresses , Random access memory - Congresses
رده :
TK
7895
.
M4
I334
1994
5. Records of the 1999 IEEE International Workshop on memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA
پدیدآورنده : edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology; in cooperation with the IEEE Solid-State Circuits Society
کتابخانه: (طهران)
موضوع : Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4I44
1999
6. System-on-a-chip
پدیدآورنده : / Rochit Rajsuman
کتابخانه: المكتبة المركزية مركز التوثيق وتزويد المصادر العلمية (أذربایجان الشرقیة)
موضوع : Embedded computer systems- Design and construction,Embedded computer systems- Testing,Application specific integrated circuits- Design and construction
رده :
E-BOOK
7. System-on-a-chip
پدیدآورنده : / Rochit Rajsuman
کتابخانه: کتابخانه مرکزی و مرکز اطلاع رسانی دانشگاه محقق اردبیلی ره (أردبیل)
موضوع : Embedded computer systems- Design and construction,Embedded computer systems- Testing,Application specific integrated circuits- Design and construction
رده :
TK7895
.
E42
,
R37
2000
